"Altera Stratix Field-Programmable Gate Array EP1S25"

A.B. Sanders1, K.A. LaBel1, C. Poivey2

1NASA/Goddard  Space Flight Center
2NASA/Muniz Engineering Inc.

Abstract

The Altera Stratix Field-Programmable Gate Array EP1S25 is based on a 1.5V, 0.13-mm, all layer copper SRAM process, with a density up to 25,660 logic elements and up to 2 Mbits of RAM.  This device offers up to 10 Digital Signal Processing (DSP) blocks with up to 80 (9-bit x 9-bit) embedded multipliers and up to 6 Phase-Locked Loops (PLLs). 

A laser test was attempted at the Naval Research Laboratory (NRL) in Washington, DC to test for sensitivities of the Altera FPGA.  The metal of device was found to be too thick for the laser to penetrate. 

Heavy Ion testing was performed at Texas A&M University Radiation Effects Facility.  Testing characterized the Altera FPGA Single Event Effects (SEE) and Single Event Latchup (SEL) sensitivity to verify compliance with its Soft Error Rate (SER) radiation design requirements.  The test evaluated the FPGA using a Hyperterminal program with 115 kbps, 8 data bits, 1 stop bit, no parity and no hardware handshaking.  The Altera FPGA test devices experienced SEL and loss of configuration < LET of 2.8 MeV/(mg/cm2) at minimum rated supply voltage (3.3 volts).  The devices were tested for fluences of 1.0x107 ions/cm2 per test.

 

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