NASA Office of Logic Design

A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.

Atmel Radiation Data

Title, Authors, Reference, Link	Abstract, Summary, Conclusions
Proton Single Event Effects Radation Test Report for the RHrFPGA Radiation_Hardened Field-Programmable Gate Array Test Report #: RTR-JL-03-026 January 9, 2004	Abstract This report describes a proton single event effects (SEE) test of three RHrFPGA integrated circuits (IC). Goddard Space Flight Center (GSFC) personnel performed the test at the Indiana University Cyclotron Facility (IUCF) on 30 October 2003 with assistance from Honeywell's RHrFPGA design and test team.
ATMEL AT40KEL040 re-programmable SRAM based FPGA Radiation Test Report: Total Dose (TID) and Single Event Effects (SEE)	Abstract (excerpt) This chip has been designed on the ATMEL CMOS 0.35 mm radiation hardened process. This report gives a summary of the radiation test results obtained on this product. An other test report covers the total dose and Single Event Effects test results for the serial 1Mbit EEPROM AT17LV010-10DP to be used as a configuration memory in association with this FPGA.
AT40KEL040 Reprogrammable SRAM based FPGA Total Dose (TID) and Single Event Effects (SEE)	*Abstract (excerpt)* Atmel has redesigned its existing commercial SRAM based reprogrammable FPGA, into a radiation hardened device: the AT40KEL040, while SEU (Single Event Upset) hardening all heavy ions susceptible structures. This chip has been designed on the Atmel CMOS 0.35 micron radiation hardened process. This report gives a summary of the radiation test results obtained on this product. In addition, some information are given on the 1Mbit Serial EEPROM AT17LV010-10DP to be used as a configuration memory in association with the AT40KEL040 FPGA.

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