ICCA Static Currents (mA)
Zero Filled One Filled S/N LAN7001 81.7 81.9 S/N LAN7002 1.2 1.2 S/N LAN7003 34.4 34.6 Other related tests:
The devices were filled with Checkerboard and Checkerboard* patterns. No change of current was observed.
S/N LAN7001 and S/N LAN7003 was power cycled 10 times each in an attempt to randomize the contents. No change of current was observed.
S/N LAN7001 and S/N LAN7003 were first filled with zeros and then backfilled with 1's while single stepping the clock. At each clock step, the static supply currents were monitored and did not change over the course of the test.
Functional Testing
No functional failures were detected during irradiation.
No functional failures were detected at VCCA (max) = 2.75VDC.
No functional failures were detected at VCCA = 1.7VDC.
Rupture Runs - Antifuse Ruptures (number and magnitudes) Added
Biases for these runs = 5.5V/2.75V
All runs with checkerboard pattern
Number of ruptures and current magnitudes are subjective so these numbers should be considered close approximations.
BNL
RunDUT
Ion
Tilt
DegRoll
DegFluence
Ions/cm2Clock
Freq# of Ruptures
Rupture Currents (mA) Strip
Chart879
LAN7003
I-127
55
0
1.00E+07
10M
5
4,6,6,8,10 7003i5.jpg 880
LAN7003
I-127
0
0
1.00E+07
10M
2
4,4 7003i6.jpg 883
LAN7002
I-127
0
0
1.00E+07
0.5M
884
LAN7002
I-127
0
0
1.00E+07
0.5M
885
LAN7002
I-127
0
0
1.00E+07
10M
886
LAN7002
I-127
55
0
1.00E+07
10M
889
LAN7001
I-127
0
0
1.00E+07
10M
890
LAN7001
I-127
55
0
1.00E+07
10M
4
5,8,10,14 7001i4.jpg 891
LAN7001
I-127
55
0
1.00E+07
0.5M
4
6,6,7,8 7001i5.jpg 892
LAN7001
I-127
0
0
1.00E+07
0.5M
893
LAN7001
I-127
55
0
1.00E+07
0.5M
1
5 7001i7.jpg 894
LAN7001
I-127
55
0
1.00E+07
0.5M
4
4,5,6,7 7001i8.jpg 895
LAN7001
I-127
0
0
1.00E+07
0.5M
896
LAN7001
Br-81
55
0
1.00E+07
0.5M
897
LAN7001
Br-81
55
0
1.00E+07
10M
898
LAN7001
Br-81
0
0
1.00E+07
10M
899
LAN7003
Br-81
55
0
1.00E+07
10M
900
LAN7003
Br-81
0
0
1.00E+07
10M
Total
19
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Last Revised:
February 03, 2010
Digital Engineering Institute
Web Grunt:
Richard Katz
