A heavy ion test was conducted at Brookhaven National Labs in November, 1998. Four A1425A devices were screened for single event latchup (SEL) and antifuse rupture. No failures were detected.
S/N LAN207, LAN208, LAN209, and LAN210 were subjected to antifuse rupture tests and single event latchup tests. The lot code for these devices is UCJ014X and the lot date code is 9819. All exposures were done at worst case bias conditions, VCC = 5.5 VDC. All runs used Bromine with a fluence per run of 107 ions/cm2.
These runs were conducted with the beam at an angle of 60 degrees, giving an effective LET of 74 MeV-cm2/mg. No failures were detected.
These runs were conducted with the beam at an angle of 0 degrees, which is the worst-case for this effect, as the "cosine" rule does not apply to this failure mechanism. No failures were detected.
Last Revised: January 09, 2002
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