"Space Hardened Low Power, Flash Memory Device Using COTS Devices"
David R. Czajkowski, Murat Goksel, Manish Pagey, Mike Fennell, and David J. Strobel
Space Micro Inc.
Space programs for NASA, DoD, and commercial satellites have a driving need for radiation hardened, high density nonvolatile devices which are truly available. This paper presents the technology, design approach, features/benefits, and data for a integrated solution device from Space Micro.
The problem with existing solutions are either lack of density (EEPROM), poor radiation performance (Flash), and/or availability (CRAM). Flash memory is attractive, but suffers from a myriad of space radiation issues including TID, SEU, and SEFI.
The mitigation technique presented in this paper uses commercial memory, plus embedded radiation protection, and advanced stacking technology.
Demonstration of SEU recovery is presented for the device, based on proton testing at the UC Davis cyclotron facility.
The development of a device to implement this function is also described with stacked engineering units. The features include:
- Density 2 gigabits
- Speed: 100 nanoseconds
- Power 350 mwatts
- Radiation hardness: 100 krads+ (Si), No SEL > 120 Mev, SEU error rate @ 1E-07 in GEO
Performance comparisons to other space memory alternatives will be provided.
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