“Initial Heavy Ion Single Event Effect (SEE) Testing of the Xilinx Virtex-II Pro Multi-Gigabit Transceivers (MGT)”
Roberto Monreal1 and Gary Swift2
1SEAKR Engineering, Inc.
2Jet Propulsion Laboratory
The Xilinx Virtex-IIP MGTs were tested with Heavy Ions as part of the continuing research done by the Xilinx SEE Consortium. The Xilinx Bit Error Rate Tester (XBERT) application was modified to ensure test stability, and SEE data was obtained at two different LET levels. The errors encountered were qualified and characterized, which will enhance the future radiation tests to obtain more meaningful results.
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