2005 MAPLD International Conference
Building and International Trade Center
September 7-9, 2005
Dr. Yuan Chen
NASA Jet Propulsion Laboratory
Dr. Yuan Chen received her Ph.D. degree in Reliability Engineering from the University of Maryland at College Park, Maryland in 1998. She is currently a Senior Engineer at Electronic Parts Engineering Office, Jet Propulsion Laboratory, Pasadena, CA. Her work has been focused on microelectronics reliability under extreme environments and development of reliability characterization and methodologies on microelectronic devices/circuits and their applications in space environments.
Before joining JPL, she was a Member of Technical Staff at Bell Labs, Lucent Technologies from 1999 to 2002 and her research and projects has included device and circuit reliability, hot carrier aging and ultra-thin oxide characterizations, wafer-level reliability, burn-in modeling and qualification methodology. She conducted her graduate studies on reliability characterization on ultra thin gate oxides with a Graduate Fellowship from the National Institute of Standards and Technologies (NIST), from 1995 to 1998. She is a senior member of IEEE and has served on the management and technical committees of IEEE International Reliability and Physics Symposium and IEEE International Integrated Reliability Workshop.
Seminars: 2005 MAPLD International Conference
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