Dr. James W. Howard, Jr. - Jackson and Tull Chartered Engineers
Invited Ethics Talk, Dr. C. Dianne Martin
Computer Science Department, The George Washington University
Recipe for Disaster: Engineering without Ethics
"Contractual Issues in Technical Monitoring"
Barto, Rod L., Spacecraft Digital Engineering
"Update on Total Dose and Single Event Effects Testing of the Intel Pentium III (P3) and AMD K7 Microprocessors"
Howard Jr., J.W., et. al.,
Jackson and Tull Chartered Engineers
"Heavy ion irradiation of SRAM-based FPGAs"
Ceschia, M., M. Bellato, M. Menichelli, A. Papi, J. Wyss and A. Paccagnella
Dipartimento di Elettronica e Informatica, UniversitÓ di Padova, Padova, Italy
"Single Event and Total Dose Effects on SEU hardened Antifuse FPGA"
Wang, Jih-Jong, et. al.,
Actel Corporation, Sunnyvale, CA
Last Revised: February 03, 2010
Digital Engineering Institute
Web Grunt: Richard Katz