2001 MAPLD International Conference

Kossiakoff Conference Center
The Johns Hopkins University - Applied Physics Laboratory
11100 Johns Hopkins Road
Laurel, Maryland 20723-6099

September 11-13, 2001


Session C. Reliability: Devices and The Effects of the Radiation Environment

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Session Chair:
Dr. James W. Howard, Jr. - Jackson and Tull Chartered Engineers

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Invited Ethics Talk, Dr. C. Dianne Martin
Computer Science Department, The George Washington University
Recipe for Disaster: Engineering without Ethics

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"Contractual Issues in Technical Monitoring"
Barto, Rod L., Spacecraft Digital Engineering

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"Update on Total Dose and Single Event Effects Testing of the Intel Pentium III (P3) and AMD K7 Microprocessors"
Howard Jr., J.W., et. al.,
Jackson and Tull Chartered Engineers

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"Heavy ion irradiation of SRAM-based FPGA’s"
Ceschia, M.,  M. Bellato, M. Menichelli, A. Papi, J. Wyss and A. Paccagnella
Dipartimento di Elettronica e Informatica, UniversitÓ di Padova, Padova, Italy

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"Single Event and Total Dose Effects on SEU hardened Antifuse FPGA"
Wang, Jih-Jong,  et. al.,
Actel Corporation, Sunnyvale, CA


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