April 23, 1996
Proton single event effect (SEE) testing was performed at UC Davis cyclotron on March 28, 1996 on the following device:
MFR Device Part # Date Code Other Markings Vcc
ATMEL FPGA AT6002-JC 9512 4D065904 5V
w/2-4K usable cells
Device was packaged in a 84-pin PLCC. Process is CMOS single poly, double metal w/epitaxial substrate. Feature size is 0.8 micron. Epi thickness is 10 um.
Device is a RAM-based programmable device with configuration downloaded via EPROM external to the device.
Test mode used:
- Dynamic: While being irradiated, a 100kHz clock is fed through a chain of 1024 stage
shift register.
Vcc, Vcc-5% and Vcc-10% were used for testing. 3 samples were tested.
One proton energy was used for testing:
- tuned 63 MeV
All test runs were performed at normal incidence of beam to device.
Output bits in error are kept count of as DATA errors (i.e., SEU in shift register). If output no longer appears as a clock signal, a device reconfiguration (i.e., SEU in configuration portion of the device) has occurred.
Fluxes: 2E8 protons/cm2/sec
Fluences: 1 to5E10 protons/cm2
This test synopsis is not intended to be a detailed report, just a quick-look at the real-time data.
Test Results
When running within device specification (Vcc and Vcc-5%) as well as operating Icc < maximum specified for the device, NO reconfigurations occurred.
A total of 3 DATA errors during 8 runs totalling 3.83E12 protons/cm2 were observed. Data error cross-sections from protons are < 2E-14 per shift register or stage.
Icc on the devices increased dramatically when TID exceeded 10-14 kRad(Si) per device. Functional failures were observed between 24-27 kRad(Si), however some annealing appeared to be occurring.
Other errors occurred only when device was out of spec for Icc or Vcc, hence, those results are not applicable for this test synopsis.
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