X. Zhu, L. Massengill, Vanderbilt University; N. Seifert, Compaq Computer
Presented at the 2002 IEEE NSREC
We analyze the impact of technology scaling and internal logic design on the soft error rate (SER) in 0.35 Ám and 0.25 Ám Alpha 21164 and 21264 microprocessors at the device, circuit and system levels.
Last Revised: February 03, 2010
Digital Engineering Institute
Web Grunt: Richard Katz