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A scientific study of the problems of digital engineering for space flight systems,
with a view to their practical solution.


Spaceborne Processors: 87C51


MEASUREMENT OF SINGLE EVENT EFFECTS IN THE 87C51 MICROCONTROLLER

Dennis L. Oberg, Member, IEEE, Jerry L. Wert, Eugene Normand, Joseph D. Ness, Peter P. Majewski, and Richard A. Kennerud

Boeing Defense & Space Group
Seattle, WA 98124-2499

wrk93a.pdf

Abstract
This report presents the results of Single Event Effect (SEE) characterization testing of the Intel 87C51FC microcontroller for use in Space Station Freedom (SSF). The 87C51FC exhibited 4 types of SEE: RAM upset and three types of system errors, i.e., reset, latchup, and power cycle (a condition not correctable by the onboard watchdog timer). The microcontroller cross sections and response rates for these single event effects were determined.

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