Dennis L. Oberg, Member, IEEE, Jerry L. Wert, Eugene Normand, Joseph D. Ness, Peter P. Majewski, and Richard A. Kennerud
Boeing Defense & Space Group
This report presents the results of Single Event Effect (SEE) characterization testing of the Intel 87C51FC microcontroller for use in Space Station Freedom (SSF). The 87C51FC exhibited 4 types of SEE: RAM upset and three types of system errors, i.e., reset, latchup, and power cycle (a condition not correctable by the onboard watchdog timer). The microcontroller cross sections and response rates for these single event effects were determined.
Last Revised: February 03, 2010
Digital Engineering Institute
Web Grunt: Richard Katz