NASA Office of Logic Design

NASA Office of Logic Design

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80C85RH-8 Total Dose Radiation Test

October 1989

 

UNISYS Interoffice Memorandum

To: Louis Thomas, Department 311

From: Tim Doyle, Department 913

Date: October 16, l989

Subject: Radiation test report an the 80C85RH-8

cc: V. Edson, V. Patel, J. Lohr, K. Sahu, J. Lander, S. Esmacher, S. Archer-Davis, R. Kulkarni, B. Meinhold, ISTP File


A radiation evaluation was performed on Harris' 80C85RH-8. The objective was to determine the radiation hardness of this component. Seven 80C85RH-8 radiation hardened, military temperature range, high reliability components were evaluated. Five were irradiated and two were controlled. The components are irradiated at GSFC, building 22, using a Cobalt-60 gamma ray source.

Originally there was to be one radiation run of 100K rads. The components were irradiated, electrical tested and passed. Additional irradiation beyond 100K rads was recommended to observe behavior in the electrical performance of the 80C85RH-8. All electrical tests were conducted at 25C.  They included DC parameters, timing parameters and four exhaustive functional tests. Bias was maintained during irradiation transportation, and annealing.

The radiation schedule:

Event Date  
Elec Test, Pre-radiation 10 Aug  
Irradiate 100K Rads 10 Aug 17 hrs, 6K/hr
Elec Test, Post 100K Rads 11 Aug  
Annealing 10 Days  
Elec Test, Post Annealing 22 Aug  
Elect Test, Pre-extended Radiation 13 Sep  
Irradiate 200K Rads 13 Sep 17 hrs, 6K/hr
Elec test, Post 200K Rads 14 Sep  
Irradiate 300K Rads 14 Sep 17 hrs, 6K/hr
Elec Test, Post 300K Rads 15 Sep  
Post 300K Rads Retest 18 Sep  

The seven parts were from two date codes 8832 (4) and 8831 (3).   One control sample from each date code was selected SN50 8831 and SN53 8832. The remaining parts were irradiated 8831: SN51 and SN52 and 8832: SN54-56.

 

Test Results

All 7 units passed the DC parameters, timing parameters, and functional tests at pre-radiation, post 100K, post annealing, and pre-extended radiation.

 

Post 200K Rads Test

3 of the 5 (SN51,52 and 56) radiated parts failed timing parameters.

SN51 failed 6 timing parameters. These were marginal failures.

SN52 failed 40 timing parameters, 11 of the 40 failures were marginal. The other 29 did not capture a value and a default was recorded.

SN56 failed 4 timing parameters. These were marginal failures.

 

Post 300K Rads Test

4 of the 5 components failed electrical tests.

SN51 failed 87 timing parameters 2 failures were marginal. The remaining 87 were default.

SN52 failed the 4MHz functional test and failed 89 timing parameter tests with default.

SN54 passed all functional, DC parameters, and timing parameters.

SN55 failed 6 timing parameters marginally.

SN56 failed 32 timing parameters. 8 were marginal failures. The other 24 were default.

 

Post 300K Rads Retest

SN51 failed 4MHz functional test and 89 timing parameters by default.

SN52 failed 4MHz functional test and 89 timing parameters by default.

SN54 was not retested because it passed post 300K Rads Test.

SN55 failed 4 timing parameters marginally.

SN56 failed 41 timing parameters 8 were marginal, the others were default.

 

Testing Summary

The 80C85RH-8-retains its integrity up to 200K Rads. Above 200K Rads there is a decline in the electrical performance of the component. I would not recommend using it above 200K Rads (si).

SN51 passed all electrical tests up to 200K Rads. At 200K Rads it failed marginally. At 300K Rads the timing failures were extensive. Plus a 4MHz functional failure.

SN52 passed all electrical tests up to 200K Rads. At 200K Rads and 300K Rads it experienced extensive timing failure. At 300K Rads it failed the 4MHz functional test.

SN54 passed all electrical tests up to and including 300K Rads

SN55 passed all electrical tests up to 200K Rads. At 300K Rads it failed marginally.

SN56 showed extensive timing parameter failures at 200K Rads and 300K Rads.


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